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“Switching characterization and failure analysis of indium selenide (In2Se3) based phase change memory”

2023-08-24
조회수 158

Heon Lee and Dae-Hwan Kang “Switching characterization and failure analysis of indium selenide (In2Se3) based phase change memory” Jpn. J. Appl. Phys. 44 (7A) pp. 4759 – 4763 (2005).


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Dep. of Semiconductor Engineering, POSTECH 77,

Cheongam-ro, Nam-Gu, Pohang, Gyeongbuk-Do, Korea

(37673)


TEL: +82-54-279-7085

E-mail: daehwankang@postech.ac.kr



Copyright ⓒ 2023. Chalcogenide Semiconductor Lab (CSL)

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Address

Dep. of Semiconductor Engineering, POSTECH 77, Cheongam-ro, Nam-Gu, Pohang, Gyeongbuk-Do, Korea (37673)


TEL: +82-54-279-7085

E-mail: daehwankang@postech.ac.kr


Copyright ⓒ 2023. Chalcogenide Semiconductor Lab (CSL) All rights reserved | Designed by greypixel