Address
Dep. of Semiconductor Engineering, POSTECH 77,
Cheongam-ro, Nam-Gu, Pohang, Gyeongbuk-Do, Korea
(37673)
TEL: +82-54-279-7085
E-mail: daehwankang@postech.ac.kr
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Copyright ⓒ 2023. Chalcogenide Semiconductor Lab (CSL)
All rights reserved | Designed by greypixel
Address
Dep. of Semiconductor Engineering, POSTECH 77, Cheongam-ro, Nam-Gu, Pohang, Gyeongbuk-Do, Korea (37673)
TEL: +82-54-279-7085
E-mail: daehwankang@postech.ac.kr
Copyright ⓒ 2023. Chalcogenide Semiconductor Lab (CSL) All rights reserved | Designed by greypixel
Junsoo Bae, Kyuman Hwang, Kwangho Park, Seongbu Jeon, Dae-Hwan Kang, Soonoh Park, Juhyeon Ahn, Seoksik Kim, Gitae Jeong, and Chilhee Chung, “Microstructural Characterization in Reliablity Measurement of Phase Change Random Access Memory” Jpn. J. Appl. Phys. 50(4), , 2011p. 04DD12 (2011).