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"Characterization of Diamond Nucleation Enhancing Layer Formed during Bias Treatment on Silicon"

2023-08-24
조회수 259

Dae-Hwan Kang, Bai.-Qin Li, Ki-Bum Kim, and Hwack-Joo Lee, "Characterization of Diamond Nucleation Enhancing Layer Formed during Bias Treatment on Silicon", Proc. of Application of Diamond Films and Related Materials, p. 337 (1995).

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Dep. of Semiconductor Engineering, POSTECH 77,

Cheongam-ro, Nam-Gu, Pohang, Gyeongbuk-Do, Korea

(37673)


TEL: +82-54-279-7085

E-mail: daehwankang@postech.ac.kr



Copyright ⓒ 2023. Chalcogenide Semiconductor Lab (CSL)

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Address

Dep. of Semiconductor Engineering, POSTECH 77, Cheongam-ro, Nam-Gu, Pohang, Gyeongbuk-Do, Korea (37673)


TEL: +82-54-279-7085

E-mail: daehwankang@postech.ac.kr


Copyright ⓒ 2023. Chalcogenide Semiconductor Lab (CSL) All rights reserved | Designed by greypixel