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2026 Paper 1
2026-05-04
조회 40

Changeon Jin,  Sunwoong Ham, Taewon Seo, Dae Hwan Kang, and Yoonyoung Chung (2026). "Quantitative Analysis and Mitigation Strategy for Hot Carrier Degradation in a-IGZO Transistor." Advanced Electronic Materials.

Address

Dep. of Semiconductor Engineering, POSTECH 77,

Cheongam-ro, Nam-Gu, Pohang, Gyeongbuk-Do, Korea

(37673)


TEL: +82-54-279-7085

E-mail: daehwankang@postech.ac.kr



Copyright ⓒ 2023. Chalcogenide Semiconductor Lab (CSL)

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Address

Dep. of Semiconductor Engineering, POSTECH 77, Cheongam-ro, Nam-Gu, Pohang, Gyeongbuk-Do, Korea (37673)


TEL: +82-54-279-7085

E-mail: daehwankang@postech.ac.kr


Copyright ⓒ 2023. Chalcogenide Semiconductor Lab (CSL) All rights reserved | Designed by greypixel